The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 1980
Filed:
Jun. 20, 1978
Applicant:
Inventors:
Assignee:
Mitsubishi Chemical Industries Limited, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
2323 / ; 424 12 ; 435-7 ;
Abstract
A method of the quantitative measurement of antigens and antibodies by reacting antibody-or antigen-sensitized insoluble carrier particles with a corresponding antigen or antibody or a mixture thereof in a sample and irradiating the reaction mixture with light which contains rays of polychromatic light having a particular wavelength region in the range of 0.6 to 2.4 microns to measure the absorbance or percent absorption of the reaction mixture, and an apparatus for use therein.
Sawai, Masanobu. (1980). Method and apparatus for the measurement of antigens and antibodies (U.S. Patent No. 4203724). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4203724
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile