The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 1980
Filed:
Oct. 28, 1977
Applicant:
Inventors:
Walter Maechtle, Ludwigshafen, DE;
Utz Klodwig, Mannheim, DE;
Assignee:
BASF Aktiengesellschaft, Ludwigshafen, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356427 ; 250573 ; 356442 ;
Abstract
A method of measurement for analytical ultracentrifuges with a multi-cell rotor and with simultaneous measurement of several cells, in which light pulses of constant energy are passed, independently of the rotor speed, through individual selectable measuring cells in the entire speed range and in which these light pulses can be provided either by a controlled laser beam or a controlled Kerr cell or a controlled gas discharge lamp.
Maechtle, Walter. (1980). Process and apparatus for optical recording of motions and states in (U.S. Patent No. 4202632). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4202632
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile