The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 1980

Filed:

Mar. 03, 1978
Applicant:
Inventors:

Gus P Tricoles, San Diego, CA (US);

Eugene L Rope, El Cajon, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
343703 ; 455 67 ;
Abstract

A method for determining antenna near-fields from measurements on a spherical surface. Phase and intensity values are measured by scanning a probe antenna over a spherical surface. The method applies both to planar or conformal antennas. The spherical surface may be in the Fresnel or Fraunhofer regions. The field at the antenna is computed utilizing the complex conjugate of the measured field. As a result, the source antenna at the point at which the antenna radiating field is evaluated is inside the measurement surface. Far-field patterns can be computed from the near-fields reconstructed from the spherical hologram surface.


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