The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 1980
Filed:
Apr. 28, 1978
Applicant:
Inventor:
Viktor Bodlaj, Munich, DE;
Assignee:
Siemens Aktiengesellschaft, Berlin & Munich, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C / ; G01S / ;
U.S. Cl.
CPC ...
356381 ; 356-1 ; 356-4 ;
Abstract
A system is disclosed for non-contact distance or thickness measurements. A deflectable laser beam scans the object and produces a measuring impulse during a forward and reverse motion when the laser beam hits a point on an object along a sighting line of a measuring detector. A rectangular pulse is produced from each measuring pulse and rising or falling edges of the rectangular pulse are used for measurement. The impulse widths and possible store times of the evaluation circuitry do not influence the measuring result in the system disclosed.