The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 1980
Filed:
Aug. 07, 1978
Herbert B Holl, Huntsville, AL (US);
Thomas G Roberts, Huntsville, AL (US);
The United States of America as represented by the Secretary of the Army, Washington, DC (US);
Abstract
An instrument (reflectometer) for continuously measuring the reflectance perties of materials as a function of the angle of incidence in which a sample and a mirror are mounted on a rotating platform in such a manner that, as the angle of incidence on the sample is varied, the reflected radiation is always incident on a detector which is fixed with respect to the rotating platform. The angle of incidence on the sample is measured and used to drive an axis of an X-Y recorder. The angle of incidence on the mirror is measured and used to correct the detected signal for any errors introduced by the properties of the mirror. This corrected signal is then used to drive the other axis of the X-Y recorder to produce a plot of the reflection coefficients vs angle of incidence for the sample. For fixed angles of incidence on the sample the detector can be moved to produce a plot of the diffused reflections as a function of the angular deviation from the specular angle. For this purpose the position of the detector is measured and used to drive the x-axis of the X-Y recorder. The input radiation is generally obtained from a laser and the instrument is supplied with polarizers or a polarization rotator as desired.