The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 29, 1980
Filed:
Jun. 01, 1978
Bruce S Buckley, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A way of automatically inspecting a machined part, for example, to a tolerance of 0.001 inches. A minicomputer monitors a change in phase, for example, of wave energy impinging upon a sample part and compares it with a change in phase of such energy for a standard or master part, any difference between the monitored changes being interpreted to determine if the sample is within acceptable tolerance limits. The inspection approach described uses no moving parts and can be used to inspect many dimensions of a part simultaneously in less than a second. Acoustic waves or microwave electromagnetic wave energy can be used to inspect parts of any shape. The inspection system disclosed can be used, as well, to monitor the geometry of an object over time to note any changes in said geometry. And the concepts of the inspection system can be employed in conjunction with robot-controlled devices to provide close-positioning data for such devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile