The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 1980

Filed:

Aug. 21, 1978
Applicant:
Inventor:

John R Flint, Barrington, IL (US);

Assignee:

Bell & Howell Company, Chicago, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 18 ; 324 / ; 371 20 ;
Abstract

Apparatus and method for testing the operability of a microprocessor and a machine controlled by the microprocessor are described. The input/output ports of the microprocessor are tested by propagating, via a test program in the microprocessor, a test logic level along the ports of the microprocessor. As the test logic level propagates, its position is revealed by the successive energization of adjacent light-emissive devices which are external to the microprocessor but connected to the microprocessor ports. Proper propagation of the test logic level is indicated by a corresponding propagation of light across the light-emissive devices. To test the machine, the microprocessor is put in a quiescent but energized state and test logic levels are applied to the ports coupling data between the microprocessor and the machine. Selected functions of the machine are thus exercised independently of the microprocessor.


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