The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 1980
Filed:
Jun. 27, 1977
David E Harris, Columbus, OH (US);
Autech, Columbus, OH (US);
Abstract
An optical gauging device wherein a laser beam is deflected to produce a bidirectional scan; a measuring portion of the split beam scans an object being inspected while the other portion scans a calibration reticle having alternating opaque and transparent bands. The alternating transmission and occultation of the beam through the reticle is used to generate calibration pulses, each representing a predetermined increment of movement of the calibration beam. The measuring portion of the beam is converted into parallel light beams which in turn are occulted by the workpiece being measured. A series of high and low square wave pulses are generated that are operative to start and stop the count of the calibration pulses. The count of the calibration pulses is directly related to the dimension of the workpiece being measured. A detector pulse enhancement circuit converts the measured signals to an accurate set of timing pulses independent of scan velocity, part size, part composition and interfering noise. The pulse generation utilizes a variable gain amplifier to provide a one-to-one output except upon the detection of a measuring signal.