The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 1980
Filed:
May. 23, 1978
Applicant:
Inventors:
Akira Kobayashi, Konan-ku, Yokohama-shi, Kanagawa, JP;
Susumu Ihara, Osaka, JP;
Assignees:
Primary Examiner:
Int. Cl.
CPC ...
G01P / ;
U.S. Cl.
CPC ...
356 28 ; 356373 ;
Abstract
The accuracy of an optical measuring system is improved by directing a parallel light beam across the surface of a moving object in a direction perpendicular to the direction of movement so that movement of the object in the direction of the light beam will not affect the measurement accuracy. For measurement purposes, the silhouette of the object can be roughened by coating with an easily removable foreign substance such as wheat flour.