The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 15, 1980

Filed:

Aug. 22, 1978
Applicant:
Inventors:

Kurt W Bailey, Royal Oak, MI (US);

Richard O Juengel, Romeo, MI (US);

Assignee:

The Valeron Corporation, Oak Park, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
3314 / ; 3314 / ; 3317 / ; 235 / ; 340754 ;
Abstract

A part sizing system in which the upper and lower tolerance limits are illuminated on the same bar graph display. Electrical representations of the upper and lower tolerance limits are alternately coupled to the bar graph display so as to superimpose visual indications of both limits on one another, with each limit being distinguishable from each other by different light intensities. In one embodiment this bar graph display is disposed adjacent another bar graph display in the same housing. The other bar graph display is utilized to provide a visual indication of the output of at least one variable reluctance transducer which measures the size of the part under test. Improved transducer excitation circuitry is also provided for insuring accurate measurements.


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