The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 1980

Filed:

Apr. 13, 1978
Applicant:
Inventors:

Willem H Diemer, Eindhoven, NL;

Gerrit Zwep, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
313 59 ; 313555 ;
Abstract

Disclosed is an X-ray tube for fluorescence analysis having an exit aperture which is closed by a window of non-uniform thickness. A thicker window portion is located at the side of the aperture remote from the anode and partly overlaps a thinner window plate. In an analysis apparatus, the thicker window portion is located in a portion of the window through which passes the radiation traversing a comparatively small distance between the anode and the specimen.


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