The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 1980
Filed:
Jun. 22, 1977
Applicant:
Inventors:
Hidetaka Takayama, Chiba, JP;
Hideo Ikeda, Kamakura, JP;
Assignee:
Nippon Kogaku K.K., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B / ; G02B / ;
U.S. Cl.
CPC ...
428213 ; 350164 ; 350165 ; 350166 ; 427164 ; 427166 ; 428448 ; 428336 ; 428451 ; 428913 ;
Abstract
Anti-reflection film for a synthetic resin base comprises a first layer of silicon dioxide (SiO.sub.2) deposited on the synthetic resin base by evaporation, a second layer of alumina (Al.sub.2 O.sub.3) deposited on the first layer by evaporation, and a third layer of silicon dioxide (SiO.sub.2) or magnesium fluoride (MgF.sub.2) deposited on the second layer by evaporation. The first layer has a geometrical film thickness of 1 to 5 .mu., the second layer has an optical film thickness of .lambda./4, and the third layer has an optical film thickness of .lambda./4.