The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 1980
Filed:
Sep. 18, 1978
Applicant:
Inventor:
Wilhelm Egle, Konigsbronn, DE;
Assignee:
Other;
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
250311 ; 2503 / ;
Abstract
The invention contemplates method and means for using an electron microscope in conjunction with a projection system whereby the microscope produces a distortion-corrected image of an object at a relatively low magnification level, the distortion-corrected image being at the object plane of the projection system, whereby magnification may be varied in accordance with excitation of the projection system, and whereby a delicate object specimen may be fixedly positioned and exposed to large-area low-level illuminating flux within the objective lens system of the microscope.