The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 1980
Filed:
Jun. 07, 1978
William H Wynn, Hillsborough, CA (US);
Monitek, Inc., Redwood City, CA (US);
Abstract
An optical concentration measuring apparatus and method which provides an output signal which is a substantially linear function of the concentration. The apparatus includes a chamber for containing a fluid sample and a source of optical radiation which develops a beam which is transmitted through the chamber and the sample. A first photoelectric cell is disposed to receive the transmitted beam for generating an electrical signal commensurate with the intensity of the beam after passage through the chamber and the fluid sample, and a second photoelectric cell which is disposed at a selected angle with respect to the direct beam for providing an electrical signal commensurate with the light scattered in a direction corresponding to the selected signal. The signal commensurate with the scattered beam and the signal commensurate with the direct beam are applied to a signal processor which develops a ratio of these signals, one of the signals being multiplied by a constant. The method allows this constant to be selected so that a signal from the signal processor is substantially linear with the particulate concentration.