The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 1980
Filed:
Mar. 29, 1978
David B Funk, Virden, IL (US);
Dickey-john Corporation, Auburn, IL (US);
Abstract
An analysis instrument for measuring selected constituents present in a sample of a material such as a bulk commodity includes a test cell to receive the sample. The test cell comprises a capacitor whose electrical properties are modified in accordance with the dielectric constant of the sample, which dielectric constant is a function of the contents of the sample. Weight and temperature sensors are provided for producing signals corresponding to the weight and temperature of the sample in the test cell. An electronic measuring circuit is connected to a test circuit including the test cell capacitor and to the weight and temperature sensors for producing an indication of the contents of the sample. The measuring circuit produces the indication by correcting a measurement taken across the test cell in accordance with the variation in the temperature of the sample from a reference temperature and the variation in the bulk density of the sample from a reference bulk density. Control circuits are provided for controlling the overall operation of the analysis instrument in accordance with predetermined instructions stored therein and with operator instructions from a control panel.