The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 1980
Filed:
Jan. 09, 1978
Fabian C Polcyn, Ann Arbor, MI (US);
Robert E Marshall, Ann Arbor, MI (US);
H Janney Nichols, Ann Arbor, MI (US);
Environmental Research Institute of Michigan, Ann Arbor, MI (US);
Abstract
To form a map of the characteristics of a microscopic specimen, the specimen is supported on a slide and a point on the specimen is subjected to either polychromatic radiation or a series of monochromatic radiations of varying wavelengths employing a condensing optical system. The resulting radiation from the point is gathered by an optical system and detected either by a single wide band detector in the case of the series of monochromatic radiations or a group of frequency selective detectors in the case of polychromatic radiation, to develop a set of signals having values which are functions of properties of the point as analyzed at the different wavelengths. The specimen is either repeatedly translated relative to the radiation source or imaged once or several times so that a signel set is derived from each elemental point on the area of the object to be analyzed in each spectral band of interest. Multi-variate statistical analysis is performed on these point sets to compare each set with one of a plurality of spectral signatures and a two dimensional map or image of the specimen area is made based on these comparisons.