The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 1980

Filed:

Jun. 30, 1978
Applicant:
Inventors:

Sung-Cheng Huang, Sherman Oaks, CA (US);

Carl J Brunnett, Mayfield Heights, OH (US);

Rodney A Mattson, Mentor, OH (US);

Assignee:

Picker Corporation, Cleveland, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
2504 / ; 250360 ;
Abstract

An improved method for computed tomographic scanning is disclosed. A beam of electromagnetic radiation subtending an angle .phi. is alternately translated and rotated past a patient. The intensity of the beam is detected by an array after the radiation passes the patient and a reconstructed image created from the detected intensities. Each rotation of the array is through an angle less than the angle .phi. subtended by the array producing redundant intensity readings for similarly oriented beam paths through the patient. This redundant intensity data is modified according to a scheme which tends to reduce motion and misalignment artifacts within the patient.


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