The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 1980

Filed:

Mar. 16, 1978
Applicant:
Inventors:

John S Liptay, Rhinebeck, NY (US);

James W Rymarczyk, Poughkeepsie, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364200 ;
Abstract

Operand controls are provided in an I-unit using address operand pairs (AOPs), each pair consisting of a request register and a buffer register. When handling variable field length (VFL) instructions with source (SRC) and destination (DST) operand addresses, two AOPs are generally assigned to receive different parts of the first subline (e.g. doubleword) of the SRC operand; this is called a duplicate fetch and is used with any size VFL operand. Efficiency is improved for the special case in which the DST operand has all of its bytes confined to a single subline in main storage by detecting the special case and inhibiting a duplicate fetch signal to the I-unit controls which assign duplicate AOPs to an instruction. The SRC operand may have more than one subline but the alignment controls force all source operand bytes into a single subline for the special case. When the duplicate fetch signal is suppressed, only one AOP is assigned by the controls to the first subline fetch for the SRC operand.


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