The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 1980

Filed:

Aug. 29, 1977
Applicant:
Inventors:

Eiichi Tanaka, Mitaka, JP;

Norimasa Nohara, Chiba, JP;

Takehiro Tomitani, Chiba, JP;

Makoto Kakegawa, Kawasaki, JP;

Nobuo Kumano, Ebina, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
2503 / ; 250369 ;
Abstract

A scintillation type radiation-measuring apparatus comprising a radiation-detecting scintillator, wherein a scintillation given off from the scintillator is converted into current by a photomultiplier tube; a current amplifier generates a plurality of pulses each proportional to the intensity of said converted current; the pulses have the width clipped by a clipped pulse generating circuit; the clipped form of the pulses is delayed by a delay circuit and integrated by an integrator; the wave height value of the outputs from the integrator is sampled by a sampling circuit to provide a sampled output; and means are provided to supply instructions to start and reset the operation of the integrator and to commence the operation of the sampling circuit in accordance with the interval between successively detected current pulses.


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