The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 29, 1980
Filed:
Jan. 18, 1978
Tomokazu Godai, Kamakura, JP;
Yasuhito Takeuchi, Fujisawa, JP;
Kozo Nakai, Fujisawa, JP;
Kazuo Takeuchi, Kamakura, JP;
Yoshihisa Morioka, Kawasaki, JP;
Kobe Steel Limited, Kobe, JP;
Abstract
A surface flaw detector includes a light source capable of generating a laser beam, a material conveyance means provided for conveying a material to be examined in the direction transverse to the axis of the material and designed to let the material rotate on its axis at a fixed position or along the direction of conveyance, means for scanning the laser beam on the surface and in the axial direction of the material which is rotating on its own axis, optical means adapted to transmit the light reflected from the surface of the material to form a stationary optic image of the scanning means, light receiving means provided at the image forming position, and processing means adapted to discriminate the flaw signal upon receiving the output from the light receiving means.