The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 1980

Filed:

Oct. 03, 1977
Applicant:
Inventors:

Ei Mochida, Tokyo, JP;

Nobuhisa Ogawa, Omiya, JP;

Hiroyuki Shinkai, Kawagoe, JP;

Masakatsu Hashimoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61K / ;
U.S. Cl.
CPC ...
424-1 ; 2323 / ; 232303 ; 232306 ; 23DI / ; 435-7 ; 424 12 ; 23DI / ;
Abstract

An immunochemical measuring method using a second antigenic substance and a labeled antibody to the second antigenic substance. An unknown amount of an antigen (Ag 1) to be measured and a given amount of a conjugate (Ag 1-Ag 2) coupled a second antigen (Ag 2) to the Ag 1 are reacted with a given amount of an antibody (Ab 1) to the Ag 1. Ag 1-Ag 2 bind to the Ab 1 in proportion to their respective amount, forming an Ab 1-Ag 1-Ag 2 complex. Then, by reaction of the complex with a labeled antibody (labeled Ab 2) to the Ag 2, Ab 1-Ag 1-Ag 2-labeled Ab 2 is formed. It is possible to estimate the amount of Ag 1 to be measured by determining the activity of labeled Ab 2 attached to the complex.


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