The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 1980
Filed:
May. 04, 1978
Applicant:
Inventor:
Joseph G Hirschberg, Coral Gables, FL (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350 13 ; 356 51 ; 356349 ; 356357 ; 356359 ;
Abstract
An interference microscope based on the principles of nonlinear optics comprises an ordinary microscope which has three additional internal optical elements, namely, two nonlinear frequency-doubling platelets and an infra-red filter, each suitably positioned. Light from an infra-red laser light source is passed through the platelets and filter, and the phase shift of the resulting image in the visible spectrum at the eyepiece is measured in order to calculate the optical thickness of a transparent object.