The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 1980
Filed:
Jun. 22, 1978
Applicant:
Inventors:
Robert B Thompson, Thousand Oaks, CA (US);
Christopher M Fortunko, Thousand Oaks, CA (US);
Assignee:
Rockwell International Corporation, El Segundo, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73640 ; 73643 ;
Abstract
A method and an apparatus are provided for ultrasonically inspecting a cylindrical object. The object is placed between the poles of a magnet to create a circumferential magnetic field in the object. A group of electromagnetic transducers (EMAT's) are placed adjacent the material so that the transducers scan the entire object when it is rotated. When an RF signal is applied to the transducers, elastic waves are generated in the material. These elastic waves reflect from defects in the material and these reflections are received by the transducers.