The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 1980
Filed:
Oct. 02, 1978
Applicant:
Inventor:
Patrick J Peoples, Intervale, NH (US);
Assignee:
Howell Laboratories, Incorporated, Bridgton, ME (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250572 ; 356446 ;
Abstract
A linear flaw detector for coated surfaces. An incident beam is provided and sensed above and below the theoretical specular angle. Where a flaw occurs, the reflected signal changes in intensity. By sensing above and below the specular angle, the signal corresponding to the flaw is accented in reference to the signals from the background. The signal corresponding to the flaw may then be separated from background noise and an output provided.