The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 1980
Filed:
Mar. 10, 1977
Applicant:
Inventors:
Yasuteru Tahara, Otake, JP;
Shunsuke Minami, Otake, JP;
Masaharu Oda, Otake, JP;
Mikio Sera, Otake, JP;
Assignee:
Mitsubishi Rayon Company, Limited, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 731 ; 356432 ;
Abstract
A method of measuring light transmission losses of optical materials comprising projecting light beams at two separate points alternatively or a light beam through a part of an optical material to be measured, and detecting the intensities of light radiated at two separate points lying along the direction of propagation of said light beams in said part.