The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 1980
Filed:
Apr. 10, 1978
Larry M Ernst, Boulder, CO (US);
Steven D Seigal, Boulder, CO (US);
George W Van Cleave, Boulder, CO (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system for checking copy quality variables within the image area of an electrophotographic machine. During a test cycle, quality is checked by producing sample test areas within the photoconductor image area ordinarily used for producing copies. Reflectance measurements are made on the sample test areas and compared to a dynamically floating reference achieved by a reflectance measurement from a cleaned portion of the photoconductor within the image area. The testing circuit is balanced so that the same reflectance voltage should be generated whether the single reflectivity-sensing device is viewing a sample test area or a cleaned reference area. The system checks for quality variables such as toner concentration, image voltage and an abnormally low reflectance photoconductor and provides a partial check on its own fault-free condition during periods when it is not in use.