The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 1980

Filed:

Aug. 11, 1978
Applicant:
Inventor:

Edward I Parker, Holden, MA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324236 ; 331 65 ;
Abstract

A pair of similar oscillators are coupled to each other such that when their natural resonant frequencies are close together they lock in and operate as synchronized oscillators over a predetermined range which can be selected by control of circuit parameters. Within the range where the oscillators are locked to be equal in frequency the phase angle between the frequency generated in each oscillator can be used as a measure of the influence on the resonant frequency of one oscillator relative to the other and where this influence is due to the parameters of an external test piece or the like influencing one oscillator, the measurement of phase angle is a measurement of a characteristic or parameter of the test piece. Accordingly, a go, no-go gauge can be operated by detecting phase differences of a predetermined magnitude using a threshold circuit or a direct indication of the phase angle can be calibrated in terms of some deviation in standard dimension or other feature of the test piece which influences the resonant frequency of one of the oscillators sufficiently to cause the synchronism between the two oscillators to be lost, each oscillator will operate at its own resonant frequency and this frequency difference can be detected to indicate that the test piece has deviated by more than a predetermined amount necessary to cause loss of synchronization. Various arrangements permit operation with static or dynamic parts which are either discrete pieces or continuous sheet bar or wire stick and the like.


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