The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 1980
Filed:
May. 25, 1978
Eiichi Goto, Fujisawa, JP;
Masanori Idesawa, Wako, JP;
Tateaki Sasaki, Tokyo, JP;
Takashi Soma, Kiyose, JP;
Rikagaku Kenkyusho, Wake, JP;
Abstract
Disclosed is an improvement of method and apparatus for varying the cross-section of a beam of electrically charged particles and projecting the so-varied beam onto the target. Passing through a plurality of apertured masks one after another, a beam of electrically charged particles is so deflected that the image of the overlapping area of the apertures of the masks appears on a target. According to this invention a beam of charged particles is deflected between two subsequent masks upstream so as to reduce the amount of beam current to that which is required in forming a desired image on the target, and the so-reduced beam is deflected between two subsequent masks downstream so as to trim and shape the cross-section of the beam into the exact and sharp contour as desired. The method and apparatus for varying and projecting a beam of electrically charged particles according to this invention are particularly useful in producing microcircuits.