The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 1979
Filed:
Sep. 01, 1977
Heikki J Sipila, Espoo, FI;
Seppo J Uusitalo, Espoo, FI;
Outokumpu Oy, Helsinki, FI;
Abstract
A method and a device for determining or observing the average particle size or particle size distribution in a flow of material, such as a slurry, wherein the material is allowed to flow at a constant velocity through a radiation beam, the time interval distribution of the radiation quanta passing through the material flow is measured, this distribution describing the particle size distribution and offering a possibility to control any changes in the size distribution, and from the measured time interval distribution is subtracted the known time interval distribution of the quanta of the radiation beam emitted by the source of radiation, this known distribution being a Poisson distribution, and, finally, the particle size or size distribution is determined arithmetically on the basis of the observed change in the time interval distribution. Preferably, the source of radiation is an X-ray tube or a radio isotope source, and the radiation detector may be a scintillation detector, a proportional counter or a semi-conductor detector.