The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 1979
Filed:
Apr. 19, 1976
John W Lundstrom, Glendora, CA (US);
Bindicator Company, Port Huron, MI (US);
Abstract
A method and apparatus for sampling and optically measuring a selected characteristic of flowing granular material in which an optical window located at one end of a hollow sight tube is disposed in the material stream at an angle with respect thereto. A dam is carried by the sight tube downstream of the window to retard material flow and cause material to collect on the window surface. The selected material characteristic may then be measured as a function of an optical characteristic of the material as viewed through the sight tube and window. An air nozzle is disposed adjacent the window to remove the collected material sample at the end of a measurement sequence.