The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 1979

Filed:

Feb. 24, 1978
Applicant:
Inventors:

Allan S Way, Irvine, CA (US);

Taylor A Reid, Costa Mesa, CA (US);

Assignee:

Beckman Instruments, Inc., Fullerton, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356321 ;
Abstract

A double beam, optical null spectrophotometer including means for automatically determining system loop gain requirements and setting the gain to the correct value for optimum response under all operating conditions. With the system ready for operation and a sample in the sample beam path, a difference signal is generated as a function of the position of a reference beam attenuator with and without a small unbalancing signal applied to the system loop. This difference signal is compared to a desired difference signal and a loop gain adjustment is made so that the difference signal will equal the desired difference signal, thereby establishing instrument gain for optimum response.


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