The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 1979

Filed:

Jan. 12, 1978
Applicant:
Inventors:

Gabor C Temes, Los Angeles, CA (US);

Derek T Cheung, Thousand Oaks, CA (US);

Assignee:

Rockwell International Corporation, El Segundo, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ;
U.S. Cl.
CPC ...
307304 ; 2502 / ; 3072 / ; 307311 ; 307D / ;
Abstract

An improved input circuit is provided for an array of photo detectors. For each photo detector in the array, the circuit utilizes a first FET with a source for coupling to an output of a photo detector, a gate coupled to a first gate voltage, and a drain for coupling to an output circuit. The first gate voltage is provided by a feedback circuit which utilizes matched properties of adjacent FETs. In one embodiment, FETs are used in an open loop feedback circuit to reduce the input impedance seen by the photodiode at the source of the first FET. A similar objective is accomplished in another embodiment utilizing FETs in a closed loop feedback circuit. Further embodiments utilize FETs arranged as a differential amplifier with active loads to provide a low input impedance and a virtual ground at the source of the first FET.


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