The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 1979
Filed:
Sep. 21, 1977
Walter Lang, Koenigsbronn, DE;
Ortwin Mueller, Koenigsbronn, DE;
Carl Zeiss Stiftung, Oberkochen, DE;
Abstract
Apparatus for use with an operating microscope employed in observing the cornea of the human eye, for example in connection with cornea transplant operations. A plexiglass tube surrounds the objective of the microscope and is fed with light from a suitable source, so that an image of the circular illuminated lower end of the plexiglass tube is reflected by the cornea of the patient back into the microscope and is observed by the person using the microscope. The character and extent of distortion of the reflected image is an indication of the corneal astigmatism. The eyepiece of the microscope is provided with a reticle in connection with which the reflected image is observed. In one form of the invention, the recticle has diametrical crossed lines and concentric circular lines. In other form of the invention the recticle has a diametrically extending linear scale, and is used in connection with an eyepiece attachment having means for rotating the recticle to align the linear scale with any desired axis of the reflected image and micrometer means for moving a pointer to measure the length of the reflected image along such axis.