The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 1979
Filed:
Dec. 23, 1977
Applicant:
Inventor:
Howard J Sloane, Fullerton, CA (US);
Assignee:
Beckman Instruments, Inc., Fullerton, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05D / ;
U.S. Cl.
CPC ...
350273 ; 356319 ;
Abstract
Apparatus compensating for 'aperturing effects' produced when a sample holding aperture is incorporated in the sample beam of a conventional dual beam spectrophotometer to allow examination of very small size samples. Such effects usually take the form of undesired variations in the base line output of the spectrophotometer at wavelengths where the spectrophotometer slits open wider than the sample aperture in an attempt to produce a constant energy scan over a given spectrum. The apparatus comprises a second aperture optically equivalent to the sample aperture and located at a slit image point in a common beam portion of the spectrophotometer.