The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 1979
Filed:
Jan. 19, 1978
Robert L Spaw, Cypress, TX (US);
Automatic Terminal Information Systems, Inc., Houston, TX (US);
Abstract
The level measuring system measures a variable level within a sensing area containing a mass of material. A sensing probe is positioned within the area and is coupled to the tank of an oscillating circuit through a switching network. A reference probe positioned in or near the sensing area is also coupled through the switching network to the tank of the oscillating circuit. The frequency of oscillation will depend upon a physical parameter of the mass of material within the immediate vicinity of sensing probe. Environmental conditions affecting the reactance of the sensing probe will equally affect the reference probe and therefore a change in the frequency produced by the sensing probe relative to the frequency produced by the reference probe will provide a true indication of the physical parameter being measured. Signal processing means are coupled to the oscillator for processing this frequency change. The sensing probe can be a cable antenna extending vertically into a material container for measuring the level of the material therein.