The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 1979

Filed:

Oct. 21, 1977
Applicant:
Inventor:

Hiromu Hayashi, Sagamihara, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
364200 ; 235302 ;
Abstract

Disclosed herein is a data processing unit including a scan-in register, a scan-out register and conventional facility and control circuit divisions. The scan-in register supplies at any desired time external predetermined control data to the facility circuit division independently from control data produced by the control circuit division. The scan-out register transmits at any desired time the control data produced by the control circuit division. Then the control data is extracted from the data processing unit. Both the scan-in register and the scan-out register are used for carrying out a diagnostic check of the facility and control circuit divisions.


Find Patent Forward Citations

Hayashi, Hiromu. (1979). Data processing unit having scan-in and scan-out means (U.S. Patent No. 4167780). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4167780

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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