The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 1979

Filed:

Jul. 07, 1978
Applicant:
Inventor:

Hermann Wollnik, Fernwald, DE;

Assignee:

Varian Mat GmbH, Bremen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D / ;
U.S. Cl.
CPC ...
250281 ; 250282 ; 250369 ;
Abstract

An improved process and an arrangement for the registration of ion-, electron- or light-spectra are described. The spectrum is guided continuously or in very small steps past an N-channel detector. After or during the time in which the spectrum shifts, all N-channels are read out. The N-channel information is added to the information in N corresponding digital or analog storage elements. Simultaneously to the shift of the spectrum past the N-channel detector or, subsequently, the information in the N storage elements are shifted one position. Thus, during the next cycle of detection, read out and addition, the information detected corresponding to a specific part of the spectrum is being added to information obtained in prior cycles from the same part of the spectrum. If this process is repeated as long as the continuous shifting of the spectrum lasts, an intensity will be registered successively in all N-channels, and then summed in the storage, corresponding to that which would be obtained if the spectrum was shifted past a gap of the width of a single channel. This sum increases at each shifting process until after N shifting the sum in an outlet register finally corresponds to the intensity integrated over N measuring cycles. Reading out the outlet register corresponds for the further data processing precisely to that of a single outlet gap so that existing data processing systems for particle or light spectrometers do not require modification for use in case of the improved registering arrangement.


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