The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 1979
Filed:
Oct. 31, 1977
Alan L Harmer, Geneva, CH;
Battelle Development Corporation, Columbus, OH (US);
Abstract
An apparatus is disclosed for measuring strain in a solid object, wherein the apparatus is arranged to use the deflection of a light guiding structure as a strain responsive element for determining the amount of applied stress to be measured. The apparatus typically comprises a curved light guiding structure including a medium of given refractive index surrounded by a medium of lower refractive index than that of the medium of given refractive index; means for injecting light into the structure and means for analyzing the change in the propagation characteristics of the light emerging from the structure; and, means for attaching and maintaining the light guiding structure to the solid object in such a way that stresses acting upon the object are translated into changes of the curved form of the structure, creating changes in the propagation of the injected light whereby the strain in the object can be determined.