The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 1979
Filed:
May. 13, 1977
Applicant:
Inventors:
Taketoshi Ishihara, Sohka, JP;
Yosiaki Watanabe, Ageo, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356125 ;
Abstract
Lens diopter measuring device includes a first and a second diopter scales which have the same but oppositely directed graduations. Correct identification of the diopters of an astigmatic lens can be obtained by bringing the second scale to zero reading at the first focus position and then adjusting the device to the second focus position.
Ishihara, Taketoshi. (1979). Method and device for measuring diopters of astigmatic lenses (U.S. Patent No. 4162852). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4162852
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile