The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 1979
Filed:
Mar. 02, 1978
Applicant:
Inventors:
Yoshihiro Sano, Katsuta, JP;
Tomio Chiba, Katsuta, JP;
Hiroyuki Kudou, Hitachi, JP;
Yoshiteru Miki, Hitachi, JP;
Assignee:
Hitachi, Ltd., , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B / ; G01R / ;
U.S. Cl.
CPC ...
250199 ; 324 96 ;
Abstract
A system for sampling and collecting simultaneously data from terminal apparatus installed at a plurality of data measuring locations (data sources) distributed in a system to be monitored or controlled by using at least a single optical fiber includes means for initiating sampling of measured quantities in response to a synchronizing signal supplied-from a master station, and means for allotting to the terminal apparatus respective particular time slots during which the data as measured is transmitted to the master station through at least a single optical fiber.