The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 1979

Filed:

Jul. 29, 1977
Applicant:
Inventors:

Toshio Takahashi, Honjo, JP;

Ryosaku Tagaya, Isesaki, JP;

Assignee:

Eisai Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07C / ;
U.S. Cl.
CPC ...
209524 ; 209538 ; 2502 / ; 356427 ;
Abstract

The characteristics of detecting and screening foreign matters that might be present in samples (e.g., ampoules containing a medical fluid) are improved by subjecting samples to more than two foreign matter detectors consecutively, applying the output signals from the detectors to paired comparators in which the comparing reference voltage is set to a high level and a low level, with the detectors being connected to the signal delay circuits that adjust with one another the output time of signals from the comparators, applying all the output signals from the comparators of the high level to an AND circuit and applying all the output signals from the comparators of low level to an OR circuit and further applying the output signals from the AND circuit and the output signals from the OR circuit to another OR circuit.


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