The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 1979
Filed:
Sep. 20, 1977
Katsuji Yamashita, Katsuta, JP;
Hiroshi Umetsu, Katsuta, JP;
Kazuyoshi Heguri, Katsuta, JP;
Kasumi Yoshida, Mito, JP;
Hitachi, Ltd., , JP;
Abstract
In an automatic chemical analyzing method and apparatus in which a plurality of samples each added with a reagent are discretely transported through a reaction line and subjected to a reaction during the transportation for optical measurement to generate measured signals and to process them, the samples to be analyzed are grouped into a plurality of sample groups each including a plurality of samples which are to be measured with respect to the same test items, which are previously stored for each sample group in a memory of a central control unit. The samples are divided by a number corresponding to the number of test items and successively fed to the reaction line one by one in sample groups, and, at the time of change of the sample group receiving the analysis, test items corresponding to a new sample group are read from the memory to carry out a chemical analysis for the samples in each sample group according to the read test items.