The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 1979

Filed:

Jan. 19, 1978
Applicant:
Inventors:

Rolf Martin, Planegg, DE;

Norbert Roth, Munich, DE;

Ruediger Froese-Peeck, Munich, DE;

Assignee:

Siemens Aktiengesellschaft, Berlin & Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250216 ; 250578 ; 350181 ;
Abstract

A method and apparatus is disclosed for the automatic and rapid recognition of faults in a surface or dimensions of an object, or for recognizing a position of the object in a field of view of an observation and/or measuring device. A photodiode row is provided having an active surface with a length dimension substantially greater than its width dimension. An anamorphotic lens system is provided which focuses a first dimension of the field of view onto the active surface length dimension and which focuses a second orthogonal dimension of the field of view onto the active surface width dimension. By means of signals from the photodiode row, theoretical dimensions can be compared with actual measured dimensions of the object.


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