The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 1979
Filed:
May. 16, 1977
Robert J Anderson, Orange, CA (US);
Robert M Studholme, Tustin, CA (US);
Beckman Instruments, Inc., Fullerton, CA (US);
Abstract
A system for the detection of precipitate-forming antigens by means of the reaction with their corresponding antibodies is disclosed. The reaction of precipitate-forming antigens with their respective antibodies produces a precipitate in proportion to either the antibody concentration or the antigen concentration, depending on which is present in excess. The method does not require formation of actual precipitate, but measures the formation of 'scattering centers' -- i.e., molecular aggregates of sufficient size to produce measurable scatter of light. The quantity of scattering centers formed is measured by nephelometric means and the measuring system performs an immunonephelometric analysis. In particular, the rate of change of the nephelometric signal with respect to time is measured and the peak rate and time to the peak rate established. From these simultaneous measurements both the antigen/antibody concentration and the condition of antibody or antigen excess are determined.