The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 1979

Filed:

Aug. 01, 1977
Applicant:
Inventor:

Leighton C Johnson, Edwardsburg, MI (US);

Assignee:

Miles Laboratories, Inc., Elkhart, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324 / ;
Abstract

An improved flow-through type particle analyzing apparatus utilizing multiple electrodes to produce an electrical pulse upon sensing a particle passing through an aperture is provided with a well-shaped liquid sample receiving receptacle or reservoir which is positioned over said aperture and comprises an orifice electrode, made at least in part of a conductive material such as metal. The construction minimizes the sample volume required to properly wet and make electrical contact with the orifice electrode, and it also minimizes the flow path of aperture current thereby correspondingly minimizing electrical noise. In a preferred embodiment means are incorporated for cleaning the particle analyzing apparatus in the immediate vicinity of the aperture, thereby minimizing the blockage and avoiding the necessity of dismantling the apparatus for cleaning.


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