The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 1979

Filed:

May. 05, 1978
Applicant:
Inventor:

Anthony M Apicella, Jr, Massillon, OH (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364469 ; 264 404 ; 264 407 ; 364473 ; 364563 ; 364567 ; 425141 ;
Abstract

The thickness of a cut length of a continuously extruded elastomer is controlled by sampling the weight of a section of the continuous extrusion at a running-weigh-scale each second; computing one-minute averages of the running-weigh-scale samples and storing 'A' to 'n' of the averages where 'A' is the newest and 'n' is the oldest stored average; sampling the extruder motor power draw each second; computing one-minute averages of the power draw and storing 'B' to 'm' of the averages where 'B' is the newest and 'm' is the oldest stored average; comparing the newest to the oldest power draw average to obtain a difference between the two and multiplying the difference by a constant indicative of the type of elastomeric material being processed through the extruder to obtain a power-draw deviation signal; sampling the weight of a cut length of material extrusion at a check-weigh-scale; comparing the check-weigh-scale value to the oldest 'n' stored running-weigh-scale one-minute average and to the power draw deviation to obtain a targeted running-weigh-scale average; comprising the targeted running-weigh-scale average to the newest 'A' stored running-weigh-scale one-minute average to obtain a deviation from the targeted value if one exists; and converting the deviation from the targeted running-weigh-scale value to a control signal for increasing or decreasing the speed of a take-away belt positioned at the extruder exit orifice to vary the thickness of the extrusion in accordance with the deviation control signal and the speed of the belt.


Find Patent Forward Citations

Apicella, Jr, Anthony. (1979). Method and apparatus for controlling the thickness of extruded stock (U.S. Patent No. 4156913). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4156913

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…