The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 1979

Filed:

Oct. 22, 1976
Applicant:
Inventors:

Clement P Aime, Mission Viejo, CA (US);

Donald L Horrocks, Placentia, CA (US);

Assignee:

Beckman Instruments, Inc., Fullerton, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
250328 ; 250369 ;
Abstract

An automatic spectrum scanning technique for use in a proportional counting instrument, such as a gamma counter or liquid scintillation counter, by means of which a pulse-height or energy spectrum of a sample can be obtained automatically and without multichannel instrumentation. A pulse-height analyzer in the counting instrument has its upper and lower discriminator limits set to define a relatively narrow counting window, and the limits are successively changed to scan the window across the energy spectrum and thereby obtain an accurate measurement thereof. Counting at each increment of the scan is continued for a preselected maximum time interval, but is quickly terminated if the count rate falls below a preselected low threshold value, and is terminated early if the count rate is relatively high, i.e., if the statistical error value associated with the count is relatively low. A technique is also disclosed for correcting the counting statistics when the sample being analyzed has a relatively short half-life and the radioactivity of the sample falls off at a relatively rapid rate.


Find Patent Forward Citations

Aime, Clement. (1979). Method and apparatus for automatic spectrum scanning in a proportional (U.S. Patent No. 4151412). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4151412

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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