The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 1979

Filed:

Jan. 16, 1978
Applicant:
Inventor:

Charles W Fetheroff, Willowick, OH (US);

Assignee:

TRW Inc., Cleveland, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73611 ; 73612 ;
Abstract

An ultrasonic inspection system including a defect gate which can be interfaced with a digital computer. A high frequency precision oscillator and two preset counters define the start and duration of a gate period or window corresponding to an inspection depth range within the test specimen. The magnitudes and locations of the two or more largest defect indications within a gate window are determined and made available to the computer for analysis and diagnosis. A rear interface gate window is provided and a determination is made as to the presence or absence within the rear interface gate window of a signal representing the rear interface of the specimen. The distance between the interrogating transducer and the test specimen front interface is also determined at each point. Means are provided for real time control of the inspection system parameters by the computer to allow adaptive control of the inspection process based on real time diagnosis of the test data.


Find Patent Forward Citations

Fetheroff, Charles. (1979). Computer controlled ultrasonic defect gate (U.S. Patent No. 4150577). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4150577

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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