The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 1979
Filed:
Apr. 14, 1977
Applicant:
Inventors:
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250252 ; 250272 ; 428344 ;
Abstract
A thickness standard sample consisting of a base plate and an even thick foil fixed on the base plate. The foil has a uniform standard thickness for calibrating an X-ray fluorescence thickness gauge or the like. The sample is very inexpensive and serves as an excellent uniform thickness standard sample so that an operator may set any point on the sample surface to the calibrating gauge axis.
Inoue, Akira. (1979). Thickness standard sample and method of calibrating gage (U.S. Patent No. 4150288). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4150288
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile