The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 1979
Filed:
Dec. 13, 1977
Peter Baues, Krailling, DE;
Hans Mahlein, Munich, DE;
Peter Moeckel, Munich, DE;
Achim Reichelt, Munich, DE;
Gerhard Winzer, Munich, DE;
Siemens Aktiengesellschaft, Berlin & Munich, DE;
Abstract
A probe for the non-contact measurement of electric or magnetic field strengths has two wave guides provided on a substrate. One of the wave guides has a measurement portion consisting of an electro-optical material or a magneto-optical material in a region of a measurement zone. A magnetic or electric field changes the index of refraction of the measuring portion and the intensity of a light wave traveling through this portion of the wave guide is reduced. Comparison is then made between a standard intensity in the other wave guide and a reduced intensity in the light traveling through the wave guide measuring portion.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile